Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Understanding connectivity issues and interactions are only part of the problem; ECOs can cause unexpected problems in other ...
When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
Virtual system integration and test using Model-Based Design uncovers errors introduced in the requirements and design phases of embedded system development, well before the physical testing phase. As ...
As boring as propeller designs may seem to the average person, occasionally there’s a bit of a dust-up in the media about a ‘new’ design that promises at least a few percent improvement in performance ...
Even though the $11 million lab is brand new, word of the facility has circulated within the academic community. Purdue has been using it to attract top engineers – including the lab's new director – ...
What are the challenges of incorporating testing and chiplets? What is a typical test configuration for testing chiplets? 1. Keysight’s M800 series bit-error-ratio testers (BERTs) support NRZ and PAM4 ...
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