The National Institute of Standards and Technology issued on Thursday NIST Special Publication 800-142: Practical Combinatorial Testing, a method aimed at cutting cost and increasing the effectiveness ...
Comparison of Gate-Level Techniques for Mitigation of Single Event Transients in Combinational Logic
Abstract: In this paper, the gate-level techniques for mitigation of Single Event Transients (SETs) in combinational circuits have been analyzed. The main objective was to compare the SET mitigation ...
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